The rapid growth in NAND automotive flash memory content and the impact of data retention through X-ray inspection and oven reflow has become a topic of discussion among automotive electronic suppliers, semiconductor vendors and programming vendors. Advancements in the flash technology to support larger storage in a small package have raised concerns on the reliability of pre-programmed devices during the manufacturing process. High energy radiation exposure can be a source of stress for some preprogrammed Managed-NAND devices if not managed properly. This stress varies depending on the grade of the managed NAND device including Commercial, Industrial and Automotive.
Our published set of Recommended Best Practices include: